2004 Release
			10/7/04		inTEST’s Temptronic Division Announces Low-Temperature Conversion Kit For Probers
			12/22/04		inTEST Introduces Universal SOC Interface

CHERRY HILL, NJ, December 22, 2004 – inTEST™ Corporation (Nasdaq: INTT), a world leader in developing and manufacturing equipment used in semiconductor testing, has announced the introduction of the Centaur Universal SOC Interface™.

The new interface is used in the testing of the SOC (System on a Chip) devices prevalent in today’s computer, communications, and consumer markets. SOC devices have become more and more complex as data rates and integration have increased. The systems that test these SOCs have kept pace, themselves becoming more and more sophisticated.

The Centaur Universal SOC Interface makes this testing less expensive.

The signal modules in a conventional interface are arranged in a radial pattern. While this works fine for most testers, this standard radial pattern is not an ideal match with the special rectangular format used in SOC testers, such as the Agilent 93000, the Teradyne FLEX family, and the Credence Sapphire. Until now, this format mismatch forced a very costly solution: using a “Blind and Buried Via PIB” instead of a regular PIB to make the connection between the interface and the SOC tester.

In most applications, the new Centaur Universal SOC Interface gets rid of this costly Blind and Buried Via PIB. The Centaur’s signal modules have been re-oriented for compatibility with the SOC testers’ rectangular format, allowing the use of a far less expensive, regular PIB during testing.
“Eliminating the Blind and Buried Via PIB is only part of the story,” said Dale Christman, General Manager of inTEST’s TestDesign™ Division. “Manufacturers especially like the fact that this one interface works with such a broad range of SOC testers. On most test floors, you’ll be able to use one probe card design for all your SOC testers. That’s important, because it simplifies test floor activity – and that increases productivity.”

The Centaur Universal SOC Interface – like the rest of the Centaur™ modular interfaces – provides remarkably distortion-free electrical performance. This is due in large part to the outstanding performance of its unique Transpar™ signal modules. The innovative Transpar module delivers extraordinary signal fidelity, virtually eliminating frequency-dependent losses. The result is an interface that is practically transparent to test signals.

The interface also features the new Transpar power transmission module, which relays power to the device under test (DUT). SOC testers produce extremely fast current changes. With conventional power transmission modules, this high rate of current change causes a sag in power supply voltage, which in turn results in testing errors. The Centaur’s new Transpar power transmission module solves this problem. Its special design limits inductance to phenomenally low levels: less than 300 picoHenries per power supply line over the entire round-trip through the interface.

There are nine separate power supply lines in each Transpar power transmission module. These can be used individually for different power supply voltages, or they can be used in parallel to achieve less than 35 picoHenries total inductance at 240 amps capacity.
The Centaur Universal SOC Interface combines these state-of-the-art capabilities with the continuing economy of a modular, open architecture design. Like all of inTEST’s Centaur modular interfaces, it mixes highly advanced standardized components with a wide variety of flexible configuration options. The Universal SOC Interface is ideal for SOC test systems manufactured by Agilent, Teradyne, and Credence.

The Centaur’s modular format also makes the interface less expensive to acquire, because the user buys only the capability needed at the time of purchase. As needs change, the Centaur interface can be economically upgraded in modular steps, to keep pace with evolving tester configurations and capabilities.

About inTEST® Corporation
inTEST Corporation (www.intest.com) is a leading independent designer, manufacturer, and marketer of products that enable semiconductor manufacturers to improve profitability by increasing the speed and efficiency of the semiconductor manufacturing process. The company’s products, used by semiconductor manufacturers to perform final testing of integrated circuits and wafers, include manipulators and docking hardware products, temperature management systems, and customized interface solutions. Headquartered in Cherry Hill, New Jersey, inTEST has manufacturing facilities in New Jersey, Massachusetts, California, Germany, the UK, and Singapore. In addition, inTEST has offices in Japan for design, sales, service, and support, with additional support personnel in Arizona.

inTEST, Centaur, Centaur Universal SOC Interface, Transpar, and Test Design are trademarks of inTEST Corporation.

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