Product Index Careers News/Events SiteMap
inTEST Products Overview
Featured Product
Test Head Manipulators
Docking Products
Test Interface Products

Interface Products Overview

inTEST Silicon Valley

Centaur Modular Interface

Centaur SOC 440 Modular Interface
<Transpar Module Overview

Cabled Wafer Probing Interfaces

Direct Dock Wafer Probing Interfaces
Custom Wafer Probing Interfaces and Accessories

V-Touch™ Extended-Life Contactors™

Temptronic Thermal Test Solutions
Product Data Sheet Download


Transpar Modules Overview            < back to Centaur SOC 440 Modular Interface
 

  New Centaur SOC 440
  Components of the Centaur Modular Interface
  Centaur Top Loading Applications and Configurations
        Transpar Modules Overview | Transpar Modules Descriptions & Applications | Transpar Modules Specifications
  Centaur Bottom Loading Universal SOC Interface
        Example Applications of the Centaur SOC interface | Transpar Power and Signal Module Specifications
  Centaur Cabled Wafer Probing Interface

 

State-of-the-Art  Transpar™ Signal Technology
The SOC 440 uses advanced  189-pin and 94-pin Transpar signal modules to transfer up to more than 4,000 signal paths between the test head and the probe card. Both the 189-pin and the 94-pin Transpar signal modules use five-wire or coplanar-ground signal path technology to assure premier electrical performance through the entire interface.

The unique Transpar signal module design delivers extraordinary signal fidelity, virtually eliminating frequency-dependent dielectric losses. The result? An interface that is practically transparent to your test signals.

• Transpar Signal Modules are ideal for digital, analog, mixed signal, and power applications.
• Robust spring pins ensure maximum availability.
• Symmetrical pin pattern allows quick, easy installation. Transpar signal modules can’t be installed incorrectly.

Over 4,000 Signal Paths Available
The SOC 440 can transfer from 512 signal paths up to more than 4,000 signal paths (and associated power/utility paths) between the tester and the probe card.

The SOC 440 is flexible, too. Its modular Centaur design lets you easily configure to whatever pin count best suits the tests you’re running, from 512 all the way to more than 4,000. As your pin count requirements grow over time, you simply add the appropriate signal modules, without changing hardware. If you add more test instruments (an AV8 Analog Card, for example), just add the matching signal modules and you’re ready to test — again, without changing any hardware.

Outstanding Bandwidth
Bandwidth is critical to the success of high-pin-count SOC testing. And the Centaur SOC 440 delivers. The SOC 440 uses proven, reliable spring-pin design to give you an extraordinary bandwidth of 2.16 GHz for the entire signal path from the pin card to the probe needle.  The Transpar module itself provides an outstanding -3dB point of over 20 GHz! (S21).

Individual Module Characteristics

Number of Pins

over 20Ghz (-3dB, S12)

Signal Pins

2.16Ghz (-3dB, S12)

Ground Pins

<50mOhm per path (includes pin and contacts to PIB and probe card

Power/Utility pins

3 Amps

Spring Force

-50ºC to +150ºC

A typical interface with 36 modules would have 2,176 I/O pins, 3,276 ground pins, and 936 power/utility pins.

 

Electrical Performance Characteristics

Module Bandwidth

over 20Ghz (-3dB, S12)

Bandwidth including PIB and Probe card trace

2.16Ghz (-3dB, S12)

Contact Resistance

<50mOhm per path (includes pin and contacts to PIB and probe card

Current Rating per Pin

3 Amps

Operating temperature range

-50ºC to +150ºC

5 Wire impedance

50 ohm +5 ohm

Number of RF ports

Up to 16






To top
© 2005-2007 inTEST Corporation. All rights reserved. Privacy/Legal.
inTEST Corporation   7 Esterbrook Lane   Cherry Hill, NJ 08003   856-424-6886


Transpar Signal Modules Vertical Hinged Lock-Down Assembly Probe Card Tray Probe Adapter Ring (PAR) Centaur Modular Interface