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Legacy Wafer Probing Interfaces            < back to Custom Wafer Probing Interfaces and Accessories     Test Head Electro-Mechanical Products   Legacy Wafer Probing Interfaces     Custom Pin Patterns are available for your existing systems.     Robust lock-down and alignment mechanisms are standard.     Detail of docking alignment and pin pattern.     Test head side of custom bottom-loading interface showing PIB and docking alignment..     Wafer side of high performance bottom-loading test interface.   If you are using older test systems, chances are that support from the manufacturers of these aging testers may not be quite as aggressive – or even as available – as it used to be. inTEST can help you keep these legacy ATE systems performing to standard by providing you with custom test interfaces. From simple probe pin towers to complete clamshell-type interfaces, we have an enormous library of custom and semi-custom designs, including types developed for many older ATE systems from Credence, SZ Test Système, Schlumberger, LTX, MegaTest, and many other ATE manufacturers. Contact inTEST today. See what we have available for your legacy ATE system. To top © 2005-2007 inTEST Corporation. All rights reserved. Privacy/Legal. inTEST Corporation   7 Esterbrook Lane   Cherry Hill, NJ 08003   856-424-6886