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Cabled Wafer Probing
Interfaces
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your rack-mount ATE to a wafer prober easily and reliably with
an inTEST cabled wafer probing interface. |
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Custom cable
assemblies bring all your test signals to the probe card.
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When you find that a direct dock test set is not practical or required,
an inTEST cabled wafer probing interface is the ideal solution.
Our cabled interface
brings all of the ATE resources to the probe card through a variety
of cable assembly types.
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An important benefit of a cabled interface is that it creates a universal
connector set which you can easily adapt to different test systems and configurations.
This way, different types of test equipment can use a common cabled interface
to the wafer prober. And that can produce a major improvement flexibility
and efficiency on your test floor.
Additionally, cabled test sets are usually quicker to changeover, when compared
to a direct dock probing test set, simply because the docking process is
eliminated.
inTEST cable assemblies incorporate robust strain relief features, and reliable
Mil-Spec connectors that provide a dependable, long lasting interconnect
system. Cable lengths are typically 48"-60". Our test interfaces
can be adapted for both top and bottom loading probe card changeovers.
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inTEST Corporation 7 Esterbrook Lane Cherry Hill, NJ 08003
856-424-6886
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