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Process Monitoring
Interface <
back to Cabled Wafer Probing Interface
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| Robust cable strain
relief ensures long cable life. |
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| Top view of interface
showing cable assemblies exiting the rear of probe interface. |
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| A variety of cable
lengths are available for this process monitoring application. |
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| Operator’s
view with interface open and ready to load probe card. |
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If you need to bring your process monitoring to wafer level, this unique
interface design does it all.
This top-loading interface is used with the PDF Real Vision test system,
and is available from either inTEST or PDF.
Each one of its eight 72”-long* AMP cables transfers 66 individual
contacts, giving you 32 force, 32 return, and 2 ground connections. When
fully populated, the interface transfers 528 contacts from the tester to
the 10”-diameter probe card.
Test verification boards are available in either 10-ohm, 100-ohm, or 100-Mohm
configurations. The interface can be easily fitted with probe adapter rings
so you can use the same tower on all your EG, Accretech, or TEL probe
stations.
*120” cables are also available.
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top
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856-424-6886
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