| |
 |
| Choose from
our large library of existing designs or build a custom interface
for your probing needs |
|
| |
|
|
The main goal of direct dock testing, where the ATE test head is directly
mounted to the wafer prober, is to enable you to more thoroughly test
an IC's functional performance.
inTEST direct-dock wafer probing interfaces give you the best of both
worlds, combining the highest performance electrical interconnect
components with the most dependable mechanical assemblies. We work
closely with the major test and wafer prober manufacturers to design
our products into their probing platforms, ensuring compatible form,
fit, and function.
Whether your application is a dedicated test cell, or a cross-platform
universal test set, our goal is to give you a test interface that
is mechanically robust and electrically superior, for all types of
devices. You can choose from a full range of designs that are optimized
for high speed digital, memory, communications, high power, and true
mixed signal devices. And inTEST interfaces can be adapted for both
top and bottom loading probe card changeovers.
|
|
To
top 
