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Credence ASL3000 < back to Direct Dock Wafer Probing Interfaces
The unique stainless steel probe card tray alleviates the need for an additional probe card stiffener frame, reducing your probe card costs and headaches. Probe card diameter is 11, providing ample space for components on the probe card. The tower is designed for easy versatility, with adapter rings available for Electroglas, Accretech, and TEL probe stations. The tower can be used with the optional hand test locking ring. This lets you mount the tower directly on the ASL3000 test head. You can perform hand test and debug operations using the same signal path that that you use at wafer test. © 2005-2007 inTEST Corporation. All rights reserved. Privacy/Legal. inTEST Corporation 7 Esterbrook Lane Cherry Hill, NJ 08003 856-424-6886 |
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